搜索包含 Scanning Electron Microscope Symposium (1974) 的图书 - 暨南大学图书馆

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	Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA 0 索取号：TN153-53/E804/1972 作者：Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、出版社：Chicago, Ill. : IITRI, 1972.		Seventh National Conference on Electron Probe Analysis 0 索取号：TN146.8-53/E801/7 作者：National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、出版社：Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]
	Sixth national conference on electron probe analysis : July 27-30, 1971 0 索取号：TN146.8-53/E801/6 作者：National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、出版社：Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.		Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974 0 索取号：TN141-53/E801/1974 作者：Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、出版社：[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
	Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.		Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].
	IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973 0 索取号：TN102-53/E801/11 作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、出版社：New York, N.Y. : IEEE, c1973.		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.		Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
	1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975		1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL 0 索取号：TN019.2/E806/1972 作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、出版社：New York : Institute of Electrical and Electronics Engineers, 1972.

	Scanning electron microscopy, 1972 : IIT research institute Chicago, Illinois 60616 USA 0 索取号：TN153-53/E804/1972 作者：Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、出版社：Chicago, Ill. : IITRI, 1972.		Seventh National Conference on Electron Probe Analysis 0 索取号：TN146.8-53/E801/7 作者：National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、出版社：Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]
	Sixth national conference on electron probe analysis : July 27-30, 1971 0 索取号：TN146.8-53/E801/6 作者：National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、出版社：Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.		Conference record of 1974 Conference on Display Devices and Systems : papers presented at the Statler Hilton, New York City, October 9-10, 1974 0 索取号：TN141-53/E801/1974 作者：Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、出版社：[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
	Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.		Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].
	IEEE conference record of 1973 Conference on Electron Device Techniques : papers presented at the Hotel Belmont-Plaza, New York City, May 1-2, 1973 0 索取号：TN102-53/E801/11 作者：Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、出版社：New York, N.Y. : IEEE, c1973.		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.		Proceedings of the International Topical Conference on Electron Beam Research and Technology, November 3-6, 1975, Albuquerque, New Mexico 0 索取号：TN1-53/E805 作者：International Topical Conference on Electron Beam Research and Technology、 Albuquerque、 N. M.、 1975.、Yonas、 Gerold.、Sandia Laboratories.、United States. Energy Research and Development Administration.、出版社：[Albuquerque, N.M.] : Sandia Laboratories ; Springfield, Va. : available from National Technical Information Service, U.S. Dept. of Commerce, 1976.
	1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975		1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL 0 索取号：TN019.2/E806/1972 作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、出版社：New York : Institute of Electrical and Electronics Engineers, 1972.